Dual profilometry based on Fourier single-pixel imaging using annular Fourier coefficient measurements
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Published:2024-07
Issue:
Volume:178
Page:108160
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ISSN:0143-8166
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Container-title:Optics and Lasers in Engineering
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language:en
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Short-container-title:Optics and Lasers in Engineering
Author:
Shao WenlongORCID,
Zhou WeishuaiORCID,
Yao Manhong,
Peng Junzheng,
Zhong Jingang
Cited by
1 articles.
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