Multi-wavelength pinhole point diffraction interferometry for optics metrology with interferometric intensity based phase retrieval method-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Multi-wavelength pinhole point diffraction interferometry for optics metrology with interferometric intensity based phase retrieval method

Published:2024-07 Issue: Volume:178 Page:108198
ISSN:0143-8166
Container-title:Optics and Lasers in Engineering
language:en
Short-container-title:Optics and Lasers in Engineering

Author:

Geng Leqi,Li Bing,Zhao Zhuo^ORCID,Lu Jiasheng

Publisher

Elsevier BV

Reference22 articles.

1. Multi-wavelength phase-shifting interferometry for micro-structures measurement based on color image processing in white light interference;Guo;Opt Lasers Eng,2016

2. Near-null interferometry using an aspheric null lens generating a broad range of variable spherical aberration for flexible test of aspheres;Xue;Opt Express,2018

3. Advances in research and applications of optical aspheric surface metrology;Liang;Chin Opt,2022

4. Compensation measurement study for aspherical primary mirror of space camera with CGH;Liu,2020

5. Measurement techniques for aspheric surface parameters;Hao;Light Adv Manuf,2023

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP