A PSD-based method for measuring the thickness and refractive index properties of optical plates
Author:
Publisher
Elsevier BV
Subject
Electrical and Electronic Engineering,Mechanical Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference7 articles.
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2. Direct measurement of refractive indices (ne, no) of a linear birefringent retardation plate;Huang;Opt Commun,1997
3. Highly sensitive instrument for measuring optical birefringence;Shindo;Polym Commun,1983
4. A measurement system for determining the thickness of an optical wave plate;Jang;Opt Commun,2005
5. Measurement of the refractive index of liquid using laser beam displacement;Nemoto;Appl Opt,1992
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