Influence of the surface and subsurface contaminants on laser-induced damage threshold of anti-reflection sub-wavelength structures working at 1064 nm-Reference-Cited by-同舟云学术

Influence of the surface and subsurface contaminants on laser-induced damage threshold of anti-reflection sub-wavelength structures working at 1064 nm

Published:2020-07 Issue: Volume:127 Page:106144
ISSN:0030-3992
Container-title:Optics & Laser Technology
language:en
Short-container-title:Optics & Laser Technology

Author:

Liu Fei,Jiao Hongfei,Ma Bin,Paschel Sebastian,Balasa Istvan,Ristau Detlev,Wang Zhanshan,Zhang Jinlong,Cheng Xinbin

Funder

National Natural Science Foundation of China

NSAF

Joint Sino-German Research Project

National Program on Key Research Project

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

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