Quantitative phase imaging by automated Cepstrum-based interferometric microscopy (CIM)
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Published:2024-10
Issue:
Volume:177
Page:111121
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ISSN:0030-3992
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Container-title:Optics & Laser Technology
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language:en
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Short-container-title:Optics & Laser Technology
Author:
Rubio-Oliver RicardoORCID,
Micó Vicente,
Zalevsky Zeev,
García JavierORCID,
Angel Picazo-Bueno Jose