Sub-micron weak phase particle characterization using the reconstructed volume intensities from in-line digital holography microscopy-Reference-Cited by-同舟云学术

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Sub-micron weak phase particle characterization using the reconstructed volume intensities from in-line digital holography microscopy

Published:2023-11 Issue: Volume:170 Page:107779
ISSN:0143-8166
Container-title:Optics and Lasers in Engineering
language:en
Short-container-title:Optics and Lasers in Engineering

Author:

Barrio-Zhang Andres^ORCID,Ardekani Arezoo M.^ORCID

Funder

National Institute of Standards and Technology

U.S. Department of Commerce

National Institute for Innovation in Manufacturing Biopharmaceuticals

Consejo Nacional de Ciencia y Tecnología

National Science Foundation

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference46 articles.

1. Microscopy by reconstructed wave-fronts;Gabor;Proc R Soc Lond Ser A, Math Phys Sci,1949

2. Recent advances in holographic 3D particle tracking;Memmolo;Adv Opt Photonics,2015

3. Digital holography and its multidimensional imaging applications: a review;Tahara;Microscopy,2018

4. Flow visualization and flow cytometry with holographic video microscopy;Cheong;Opt Express,2009

5. Improving axial localization of weak phase particles in digital in-line holography;Shangraw;Appl Opt,2021

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