Talbot wavefront sensor measurement possibilities under gaussian illumination-Reference-Cited by-同舟云学术

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Talbot wavefront sensor measurement possibilities under gaussian illumination

Published:2023-10 Issue: Volume:169 Page:107718
ISSN:0143-8166
Container-title:Optics and Lasers in Engineering
language:en
Short-container-title:Optics and Lasers in Engineering

Author:

Kotov Myhailo M.,Danko Volodymyr P.,Goloborodko Andrii O.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference48 articles.

1. Measurement of light-phase distortions in an acousto-optical deflector with Shack-Hartmann wavefront sensor;Podanchuk,1999

2. Determination of local surface defects using a Shack-Hartmann wavefront sensor;Goloborodko;Ukr J Phys,2008

3. Adaptive optics wide-field microscopy using direct wavefront sensing;Azucena;Opt Lett,2011

4. Aberration mapping for sight correction;Molebny,1998

5. Refraction mapping of translucent objects with Shack-Hartmann sensor;Molebny,1998

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Talbot phenomenon in binary optical gratings under Gaussian illumination;Optik;2024-09

2. Performance of a reference-free wavefront sensor based on the Talbot effect under Gaussian illumination;Journal of the Optical Society of America A;2024-08-05

3. Corrigendum to “Talbot wavefront sensor measurement possibilities under Gaussian illumination” [Opt. Lasers Eng. 169 (2023) 107718];Optics and Lasers in Engineering;2024-05

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