Combination of muller matrix polarimetry and z-scan techniques for nonlinear refractive index measurement

Author:

Alsaedi Khitam,Madanipour KhosroORCID

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference25 articles.

1. High sensitivity, single beam n2 measurements;Sheik-Bahae;Opt Lett,1989

2. Sensitive measurement of optical nonlinearities using a single beam;Sheik-Bahae;IEEE J Quantum Electron,1990

3. Z-Scan Measurements of optical nonlinearities;Van Stryland;Charact Tech Tabul Org Nonlinear Mater,1998

4. Polarization-dependent effects of refractive index change associated with photoisomerization investigated with Z-scan technique;Liang;J Appl Phys,2007

5. Modified z-scan techniques for investigations of nonlinear chiroptical effects;Markowicz;Opt Express,2004

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