Self-marking phase-stepping electronic speckle pattern interferometry (ESPI) for determining a phase map with least residues
Author:
Publisher
Elsevier BV
Subject
Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
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2. Application of 3D electronic speckle pattern interferometry for the analysis of thermal response in printed circuit boards;Procedia Structural Integrity;2019
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4. Optimum Image Extraction and Phase Analysis for ESPI Measurements Under Environmental Disturbance;Experimental Mechanics;2016-02-16
5. Surface Crack Search and Marking on Materials with Regional Phase Unwrapping Technology;Advanced Materials Research;2011-07
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