Off-axis differential interference contrast (DIC) microscopy enabled by polarization gratings pair and synthetic aperture technology for integrational and sectional quantitative phase imaging-Reference-Cited by-同舟云学术

Off-axis differential interference contrast (DIC) microscopy enabled by polarization gratings pair and synthetic aperture technology for integrational and sectional quantitative phase imaging

Published:2023-04 Issue: Volume:163 Page:107441
ISSN:0143-8166
Container-title:Optics and Lasers in Engineering
language:en
Short-container-title:Optics and Lasers in Engineering

Author:

Wang Yi^ORCID,Zhong Liyun^ORCID,Xing Xinyue,Lu Xiaoxu^ORCID,Chen Qiujia,Tao Qiao,Qin Yuwen^ORCID

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference32 articles.

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4. Wide-field, high-resolution Fourier ptychographic microscopy;Zheng;Nat Photonics,2013

5. Noninterferometric Phase Imaging with Partially Coherent Light;Paganin;Phys Rev Lett,1998

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