Phase diagram of the holmium-silicon binary system and physical properties of holmium silicides up to 1050 °C

Author:

Eremenko V.N.,Listovnichii V.E.,Luzan S.P.,Buyanov Yu.I.,Martsenyuk P.S.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Mechanical Engineering,Mechanics of Materials

Cited by 31 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Structure variations within RSi2 and R 2Si3 silicides. Part II. Structure driving factors;Acta Crystallographica Section B Structural Science, Crystal Engineering and Materials;2020-05-15

2. Structure variations within RSi2 and R 2 TSi3 silicides. Part I. Structure overview;Acta Crystallographica Section B Structural Science, Crystal Engineering and Materials;2020-03-12

3. Improved reduction of contact resistance in NiSi/Si junction using Holmium interlayer;Microelectronic Engineering;2020-01

4. Structural and magnetic properties of Pr5Si3-xGex compounds;Journal of Alloys and Compounds;2019-06

5. Solid-State Phase Diagram of the Ho-Zr-Si Ternary System at 973 K (700 °C);Metallurgical and Materials Transactions A;2018-11-27

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