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SIMS study of low energy 2H+ ion-implanted YBa2Cu3O7−δ thin films

  • Published:1993-05 Issue: Volume:195 Page:141-144
  • ISSN:0925-8388
  • Container-title:Journal of Alloys and Compounds
  • language:en
  • Short-container-title:Journal of Alloys and Compounds

Author:

Saba F.M.,Kilner J.A.,Tate T.J.,Lee M.J.,Radcliffe J.W.,Cohen L.F.,Quincey P.,Somekh R.E.,Przyslupski P.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Mechanical Engineering,Mechanics of Materials

Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Ion implantation and mass transport in YBa2Cu3O7−δ films and substrates;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1998-04

2. Hydrogen in high-Tc superconductors;Physica Status Solidi (a);1996-08-16

3. Effects of 50 keV2H+-ion implantation and rapid thermal annealing on the microstructure of YBCO thin films;Journal of Materials Science;1995-12

4. A study of2H trapping and release in2H+‐irradiated YBa2Cu3O7−δ /MgO〈100〉;Journal of Applied Physics;1995-07

5. SIMS study of deuterium trapping and migration in a YBa2Cu3O7−δ thin film;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1995-05
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