An examination of the electronic structure of SiO by soft x-ray emission spectroscopy
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Condensed Matter Physics,General Chemistry
Reference16 articles.
1. Chemical bond and related properties of SiO2. VII. Structure and electronic properties of the SiOx region of Si–SiO2 interfaces
2. Chemical bond and related properties of SiO2 III. Core-level shifts in SiOx
3. Diffraction Investigation on the Structure of SiOx
4. An electron diffraction study of amorphous silicon oxide films
5. Structure of Amorphous Silicon Monoxide
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Exchange coupling in multilayers with semiconductors;Applied Physics A Materials Science & Processing;1995-04
2. Auger oxygen KLL lineshapes in silicon oxides: pattern recognition analysis;Applied Surface Science;1993-06
3. Electronic structure of amorphousSiOx:H alloy films studied by x-ray emission spectroscopy: SiK, SiL, and OKemission bands;Physical Review B;1993-03-15
4. Exchange-Coupling Between Ferromagnets Across Non-Metallic Amorphous Spacer-Layers: Si and SiO;Magnetism and Structure in Systems of Reduced Dimension;1993
5. Interpretation of the x-ray emission spectra of a-SiOx;Solid State Communications;1992-07
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