A novel ultrasonic resonance sample-tip distance regulation for near field optical microscopy and shear force microscopy
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Condensed Matter Physics,General Chemistry
Reference5 articles.
1. Breaking the Diffraction Barrier: Optical Microscopy on a Nanometric Scale
2. Near‐field optical‐scanning microscopy
3. Near-Field Optics: Microscopy, Spectroscopy, and Surface Modification Beyond the Diffraction Limit
4. New form of scanning optical microscopy
5. Piezoelectric tip‐sample distance control for near field optical microscopes
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1. Study on residual resist layer thickness measurement for Nanoimprint Lithography based on near-field optics;International Journal of Surface Science and Engineering;2009
2. Fullerene Thin Films as Photovoltaic Material;Nanostructured Materials for Solar Energy Conversion;2006
3. THE INFLUENCE OF HUMIDITY ON THE SHEAR FORCE BETWEEN TIP AND SAMPLE IN NSOM USING PIEZOELECTRIC FORK;Surface Review and Letters;2005-06
4. Shear-Force Detection by Reusable Quartz Tuning Fork without External Vibration;Optical Review;2003-03
5. Shear Force Detection Using Single-Tine Oscillating Tuning Fork for Scanning Near-Field Optical Microscopy;Chinese Physics Letters;2003-02-27
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