Characterization of porous silicon layers by grazing- incidence X-ray fluorescence and diffraction-Reference-Cited by-同舟云学术

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Characterization of porous silicon layers by grazing- incidence X-ray fluorescence and diffraction

Published:1991-09 Issue:11 Volume:79 Page:923-928
ISSN:0038-1098
Container-title:Solid State Communications
language:en
Short-container-title:Solid State Communications

Author:

Bensaid A.,Patrat G.,Brunel M.,de Bergevin F.,Hérino R.

Publisher

Elsevier BV

Subject

Materials Chemistry,Condensed Matter Physics,General Chemistry

Reference17 articles.

1. Porous silicon: The material and its applications to SOI technologies

2. Silicon quantum wire array fabrication by electrochemical and chemical dissolution of wafers

3. Porosity and Pore Size Distributions of Porous Silicon Layers

Cited by 55 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Piezoelectric Properties of Porous Silicon;JETP Letters;2021-11

2. Correlation of Structural, Morphological and Electrochemical Impedance Study of Electrochemically Prepared p-Type Porous Silicon;Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques;2021-07

3. X-ray scattering profiles: revealing the porosity gradient in porous silicon;Journal of Applied Crystallography;2021-05-25

4. In-Depth Analysis of Porous Si Electrodes for Supercapacitors;The Journal of Physical Chemistry C;2021-03-11

5. Biodegradation of inorganic drug delivery systems in subcutaneous conditions;European Journal of Pharmaceutics and Biopharmaceutics;2018-01

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