High-speed scanning Hall-probe microscopy for two-dimensional characterization of local critical current density in long-length coated conductor-Reference-Cited by-同舟云学术

High-speed scanning Hall-probe microscopy for two-dimensional characterization of local critical current density in long-length coated conductor

Published:2012 Issue: Volume:27 Page:228-231
ISSN:1875-3892
Container-title:Physics Procedia
language:en
Short-container-title:Physics Procedia

Author:

Higashikawa Kohei,Shiohara Kei,Komaki Yoshihiro,Okumura Keitaro,Imamura Kazutaka,Inoue Masayoshi,Kiss Takanobu,Iijima Yasuhiro,Saitoh Takashi,Machi Takato,Yoshizumi Masateru,Izumi Teruo,Okamoto Hiroshi

Publisher

Elsevier BV

Subject

General Engineering

Reference6 articles.

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5. K. Higashikawa, M. Inoue, T. Kawaguchi, K. Shiohara, K. Imamura, T. Kiss, Y. Iijima, K. Kakimoto, T. Saitoh, T. Izumi, Physica C in press.

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