Volterra kernels measurement and the application in post calibration of ADCs
Author:
Publisher
Elsevier BV
Subject
General Engineering
Reference11 articles.
1. Niclas Bjorsell, Daniel Ronnow, and Peter Handel, “Measuring Volterra kernels of analog to digital converters using a stepped three-tone scan,” IMTC 2006 –Instrumentation and Measurement Technology Conference, Sorrento, Italy 24-27 April 2006.
2. Niclas Bjorsell, Petr Suchanek, Peter Handel and Daniel Ronnow, “Measuring Volterra Kernels of Analog-to-Digital Converters Using a Stepped Three-Tone Scan,” IEEE Transactions on Instrumentation and Measurement, vol. 57, No.4, April 2008.
3. Kenneth C. Dyer, Daihong Fu, Stephen H. Lewis, and Paul J. Hurst, “An Analog Background Calibration Technique for Time-Interleaved Analog-to-Digital Converters,” IEEE journal of solid-state circuits, vol. 33, No. 12, December 1998.
4. J. Tsimbinos and K.V. Lever, “Applications of higher-order statistics to modelling, identification and cancellation of nonlinear distortion in high-speed samplers and analogue-to-digital converters using the Volterra and Wiener models,” IEEE Signal. Processing;1; Workshop on Higher-Order Statistics, 1993: 379-383.
5. Background interstage gain calibration technique for pipelined ADCs;Keane;IEEE Transactions on Circuits and Systems I: Regular Papers,2005
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