Performance and Characterization of CsI:Tl thin Films for X-ray Imaging Application
Author:
Publisher
Elsevier BV
Subject
General Engineering
Reference8 articles.
1. Martin Nikl, Scintillation detectors for x-ray, Meas. Sci. Technol. 17 (2006).
2. Bates, Scintillation Processes in Thin Films of CsI(Na) and CsI(Tl) used to Low Energy X-rays, Electrons and Protons, in Photo-Electronic Image Devices, Eds. J.D. McGee, D. McMillan, E. Kahan, B.L. Morgan, pp. 451-459, Academic Press, London-New York (1969).
3. Structured CsI(Tl) Scintillators for X-ray Imaging Applications;Nagarkar;IEEE Trans. Nucl. Sci,1998
4. V.V. Nagarkar, S.V. Tipnis, S.R. Miller, and V. B. Gaysinskiy, A Comparative Study of CsI(Tl) Screens for Macromolecular Crystallography, Proc. SPIE, Vol. 4508, pp.15-19, (2001).
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