Short-Circuit Tests and Simulations with a SCFCL Modular Assembly
Author:
Publisher
Elsevier BV
Subject
General Engineering
Reference6 articles.
1. S. Elschner, et al., IEEE Trans. App. Superconductivity,vol.18,No2(2003) 1980.
2. A Polasek, R Dias, ET Serra, O. Filho and D. Niedu, J. Phys.: Conf. Ser. No. 234 (2010) 32048.
3. C. Kurupakorn, et al., J. Phys.: Conf. Ser. 43 (2006) 950.
4. W. Paul, et al., Physica C, 354 (2001) 27.
5. J. Langston, M. Steureur, et al., IEEE Trans. App. Superconductivity,vol. 15, No.2(2005) 2090.
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