Examination of the Scaling Behavior of Critical Properties in MgB2/SiC/Si Thin Films
Author:
Publisher
Elsevier BV
Subject
General Engineering
Reference5 articles.
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3. Kitahara K, Akune T, Matsumoto Y, Sakamoto N. P hysica C 445-448 (2006) 471-473.
4. Investigation of critical properties in MgB2/SiC/Si thin films prepared under varied conditions
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1. Scaling analyses on the critical current density in MgB2/NbN/Si thin film;Journal of Physics: Conference Series;2020-06-01
2. Scaling analyses on the critical current density in MgB2/SiC/Si thin film processed at higher temperature;IOP Conference Series: Materials Science and Engineering;2019-04-15
3. Comparison of Critical Current Scaling Behaviors in $$\hbox {MgB}_{2}$$ MgB 2 /SiC/Si Thin Films;Journal of Low Temperature Physics;2017-04-06
4. Comparison of critical properties in MgB2nanometer films prepared on SiC/Si substrate;Journal of Physics: Conference Series;2014-05-12
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