Lepton contamination and photon scatter produced by open field X-ray beams in the build-up region
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Radiation
Reference9 articles.
1. Characteristics of contamination electrons in high energy photon beams;Beauvais;Radiother. Oncol.,1993
2. 6MV X-ray dose in the build up region: empirical model and the incident angle effect;Butson;Aust. Phys. Sci. Eng. Med.,1996
3. A solid water phantom material for radiotherapy X-ray and gamma ray beam ray calculations;Constanitinou;Med. Phys.,1982
4. Bjarngard electron disequilibrium in high energy X-ray beams;Hannallah;Med. Phys.,1996
5. Electron contamination and build up doses in conformal radiotherapy fields;Hounsell;Phys. Med. Biol.,1999
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