Differentiation between tracks and damages in SSNTD under the atomic force microscope-Reference-Cited by-同舟云学术

Differentiation between tracks and damages in SSNTD under the atomic force microscope

Published:2003-06 Issue:1-6 Volume:36 Page:155-159
ISSN:1350-4487
Container-title:Radiation Measurements
language:en
Short-container-title:Radiation Measurements

Author:

Ho J.P.Y.,Yip C.W.Y.,Nikezic D.,Yu K.N.

Publisher

Elsevier BV

Subject

Instrumentation,Radiation

Reference11 articles.

1. Measurement of general etch rate for CR-39 plastic at short distance scale;He;Nucl. Instrum. Methods B,1997

2. Measurement of bulk etch rate of LR 115 detector with atomic force microscopy;Ho;Radiat. Meas.,2002

3. Ho, J.P.Y., Yip, C.W.Y., Nikezic, D., Yu, K.N., 2002b. Determination of track dimensions by atomic force microscope. 21st International Conference on Nuclear Tracks in Solids, 21–25 October, New Delhi, India.

4. Observation of nuclear track in organic material by atomic force microscopy in real time during etching;Palmino;Radiat. Meas.,1999

5. Investigation of nuclear reaction products by atomic force microscopy;Rozlosnik;Radiat. Meas.,1997

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2. A New Treatment to Compute the Track Parameters in PADC Detector using Track Opening Measurement;Journal of Physical Science;2018-08-25

3. Online optical monitor of alpha radiations using a polymeric solid state nuclear track detector CR-39;Sensors and Actuators B: Chemical;2012-01

4. Biocompatibility enhancement of chemically etched CR-39 SSNTDs through superficial pore formation by alpha-particle irradiation;Radiation Measurements;2008-08

5. Use of CR-39 in Pd/D co-deposition experiments;The European Physical Journal Applied Physics;2007-12