Impact of deep cryogenic temperatures on gate stack dual material DG MOSFET performance: Analog and RF analysis
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Published:2024-09
Issue:
Volume:9
Page:100725
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ISSN:2772-6711
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Container-title:e-Prime - Advances in Electrical Engineering, Electronics and Energy
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language:en
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Short-container-title:e-Prime - Advances in Electrical Engineering, Electronics and Energy
Author:
Das Satish K.,
Biswal Sudhansu M.,
Giri Lalat Indu,
Nanda UmakantaORCID
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