Appendix II A History of the Scanning Electron Microscope, 1928

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Appendix II A History of the Scanning Electron Microscope, 1928–1965

Published:2004 Issue: Volume: Page:523-545
ISSN:1076-5670
Container-title:Advances in Imaging and Electron Physics
language:
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Author:

Mcmullan D.

Publisher

Elsevier

Reference51 articles.

1. The application of the electron microscope in metallography;Allen;London, 1949,1949

2. The American scene: Scanning electron microscope for inspection of semiconductor microcircuits;The Engineer,1965

3. Electric time pieces and telegraphs;Bain,1843

4. Detection and analysis of low-energy disintegration particles;Baxter,1949

5. The scanning electron microscope [in French];Bernard;Ann. Univ. Lyon Sci. Sect. B[3],1957

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