Ghost pattern images of a current density filament formed by low-temperature impurity breakdown in n-GaAs-Reference-Cited by-同舟云学术

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Ghost pattern images of a current density filament formed by low-temperature impurity breakdown in n-GaAs

Published:2000-04 Issue:3 Volume:268 Page:195-201
ISSN:0375-9601
Container-title:Physics Letters A
language:en
Short-container-title:Physics Letters A

Author:

Aoki Kazunori

Publisher

Elsevier BV

Subject

General Physics and Astronomy

Reference15 articles.

1. Nonequilibrium Phase Transitions in Semiconductors;Schöll,1987

2. Encounter with Chaos;Peinke,1992

3. Nonlinear response and chaos in semiconductors induced by impact ionization

4. Nonlinear Dynamics and Chaos in Semiconductors;Aoki,1999

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Anomalous PL brightening caused by impact formation of a (D + , X) complex during an impact ionization avalanche in n‐GaAs;physica status solidi (c);2003-01-27

2. Evolution of bright (D+,X) PL pattern during impact ionization avalanche in n-GaAs;Physica B: Condensed Matter;2002-03

3. Spatiotemporal PL imaging of current density filaments during impact ionization avalanche in high-purity n-GaAs;Solid State Communications;2002-01

4. Anomalous brightening of donor-bound exciton photoluminescence caused by a pulsed electric field in n-GaAs;Physica B: Condensed Matter;2001-01

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