A FET Mounted Nano Probe with a CNT for Surface Electrical Properties

Author:

Shin Kumjae,An Taechang,Moon Wonkyu,Lim Geunbae,Jeon Jong Up

Publisher

Elsevier BV

Subject

Applied Mathematics

Reference6 articles.

1. D.M. Chiang et al. , Chem. Phys. Lett., Vol. 412, No. 1-3, pp.50-54,2005.

2. S. H. Lee, G. Lim, and W. Moon, “A Novel SPM Probe with MOS Transistor and Nano Tip for Surface Electric Properties,” J. Phys.: Conference Series, Vol. 61, pp. 678-682, 2007.

3. Sang H. Lee, Geunbae Lim, Hyunjung Shin, and Wonkyu Moon, “Fabrication and evaluation of metal-oxide-semiconductor transistor probe,” IEEE-NANO 2007, pp. 470-473, 2007.

4. Sang H. Lee, Geunbae Lim, Hyunjung Shin, and Wonkyu Moon, “Fabrication and Evaluation of V-Shaped MOS transistor probe,” IEEE-MEMS 2008, pp. 351-354 2008.

5. Sang H. Lee, Geunbae Lim, Wonkyu Moon,, Hyunjung Shin and Cheong-Wol Kim, “V-shaped metal–oxide–semiconductor transistor probe with nano tip for surface electric properties,” Ultramicroscopy, Vol. 108, pp. 1094-1100, 2008.

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