1. M. Campbell et al, The Drivers of the Levelized Cost of Electricity for Utility-Scale Photovoltaics, M. Campbell et al, SunPower whitepaper (2008).
2. E. Maset et al, IEEE Transactions on Device and Materials Reliability, Vol. 9, No. 4, December 2009.
3. Reliability investigation and characterization of failure modes in Schottky diodes
4. W. Nelson, Accelerated Life Testing: Statistical Models Test Plan and Data Analysis, J. Wiley, New York, USA, (2004).
5. M. Mikofski et al, PVLife: An Integrated Model for Predicting PV Performance Degradation over 25+ Years, 38th IEEE PVSC, Austin TX, (2012).