The Original Correlations in the Structural Properties and Surface Activity Changes of the CdSe-CdTe System Semiconductors

Author:

Kirovskaya I.A.,Bukashkina T.L.,Polonyankin D.A.

Publisher

Elsevier BV

Subject

Applied Mathematics

Reference11 articles.

1. Solid solutions of binary and multicomponent semiconductor systems /I;Kirovskaya;A. Kirovskaya. – Omsk: Omsk State Technical University,2010

2. I.A. Kirovskay, T.L. Bukashkina, D.S. Tarbaeva, S.V. Propp, The preparation and certification of solid solutions CdTe-CdSe //Materials of IV all-Russian scientific-technical conference “Russia Young: advanced technologies – in the industry”. Book 1. Omsk. 2011. pp. 354-358. (In Russian).

3. Mirkin E.S. Handbook of x-ray diffraction analysis. Moscow: GOS. Fiz. -Mat. lit-ry, 1961, 863 p. (In Russian).

4. S.S. Gorelik, Radiography and electronoptical analysis /S. S. Gorelik, L.N. Rastorguev, Yu. A. Skakov. – M.: Metallurgy, 1970, 107 p. (In Russian).

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