The Surface Activity Forecast Implementation of the Semiconductor Materials ZnTe (AIIIBV) and ZnTe (AIIBIV) for the Gas Analysis-Reference-Cited by-同舟云学术

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The Surface Activity Forecast Implementation of the Semiconductor Materials ZnTe (AIIIBV) and ZnTe (AIIBIV) for the Gas Analysis

Published:2016 Issue: Volume:152 Page:551-555
ISSN:1877-7058
Container-title:Procedia Engineering
language:en
Short-container-title:Procedia Engineering

Author:

Kirovskaya I.A.,Novgorodtseva L.V.,Kosarev B.A.,Zverev M.A.

Publisher

Elsevier BV

Subject

Applied Mathematics

Reference9 articles.

1. Solid solutions of binary and multicomponent semiconductor systems, OmSTU;Kirovskaya;Omsk,2010

2. Radiography and electronoptical analysis;Gorelik,1970

3. Handbook of x-ray diffraction analysis, State;Mirkin,1961

4. X-ray diffraction determination of the composition of in xGa1-xSb solid solution;Parkhomenko;Rus. J. Inorganic Material,2010

5. Microscopic methods of materials research;Clark,2007

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