Kelvin probe and ultraviolet photoemission measurements of indium tin oxide work function: a comparison-Reference-Cited by-同舟云学术

Kelvin probe and ultraviolet photoemission measurements of indium tin oxide work function: a comparison

Published:2000-06 Issue: Volume:111-112 Page:311-314
ISSN:0379-6779
Container-title:Synthetic Metals
language:en
Short-container-title:Synthetic Metals

Author:

Kim J.S.,Lägel B.,Moons E.,Johansson N.,Baikie I.D.,Salaneck W.R.,Friend R.H.,Cacialli F.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference12 articles.

1. Indium–tin oxide treatments for single- and double-layer polymeric light-emitting diodes: The relation between the anode physical, chemical, and morphological properties and the device performance

2. The Surface Science of Metal Oxides;Henrich,1994

3. Analysis of stray capacitance in the Kelvin method

4. Low cost PC based scanning Kelvin probe

5. Low-Energy Electrons and Surface Chemistry;Ertl,1985

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