Point defects in crystalline silicon, their migration and their relation to the amorphous phase

Author:

Maroudas Dimitris,Pantelides Sokrates T.

Publisher

Elsevier BV

Subject

Applied Mathematics,Industrial and Manufacturing Engineering,General Chemical Engineering,General Chemistry

Reference60 articles.

1. Dislocations, vacancies and interstitials;Balluffi,1979

2. Silicon vacancy: a possible Anderson negative-U system;Baraff;Phys. Rev. Lett.,1979

3. Barrier to migration of the silicon self-interstitial;Bar-Yam;Phys. Rev. Lett.,1984

4. Electronic structure and total energy migration barriers of silicon self-interstitials;Bar-Yam;Phys. Rev.,1984

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