A Bayesian approach to prediction of system failure rates by criticalities under event trees-Reference-Cited by-同舟云学术

A Bayesian approach to prediction of system failure rates by criticalities under event trees

Published:1999-04 Issue: Volume:60-61 Page:623-628
ISSN:0925-5273
Container-title:International Journal of Production Economics
language:en
Short-container-title:International Journal of Production Economics

Author:

Jun Chi-Hyuck,Y. Chang Soo,Hong Yushin,Yang Heejoong

Publisher

Elsevier BV

Subject

Industrial and Manufacturing Engineering,Management Science and Operations Research,Economics and Econometrics,General Business, Management and Accounting

Reference7 articles.

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5. R.M. Oliver and H.J. Yang, Bayesian updating of event tree parameters to predict high risk incidents, in: R.M. Oliver, J.Q. Smith (Eds.), Influence Diagrams, Belief Nets and Decision Analysis, Ch. 12, Wiley, Chichester, 1990, pp. 277–296.

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4. Accident modelling and analysis in process industries;Journal of Loss Prevention in the Process Industries;2014-11

5. References;Lees' Loss Prevention in the Process Industries;2012