Carbon-13 labeling for improved tracer depth profiling of organic materials using secondary ion mass spectrometry-Reference-Cited by-同舟云学术

Carbon-13 labeling for improved tracer depth profiling of organic materials using secondary ion mass spectrometry

Author:

Harton S. E.¹,Stevie F. A.²,Ade H.³

Affiliation:

1. Department of Materials Science and Engineering, North Carolina State University, Raleigh, North Carolina, USA

2. Analytical Instrumentation Facility, North Carolina State University, Raleigh, North Carolina, USA

3. Department of Physics, North Carolina State University, 27695, Raleigh, NC, USA

Publisher

American Chemical Society (ACS)

Subject

Spectroscopy,Structural Biology

Link

Reference21 articles.

Cited by 11 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

2. Understanding of CO2 interaction with thermally grown SiO2 on Si using IBA depth profiling techniques;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2013-06