Metal imaging on surface of micro- and nanoelectronic devices by laser ablation inductively coupled plasma mass spectrometry and possibility to measure at nanometer range-Reference-Cited by-同舟云学术

Metal imaging on surface of micro- and nanoelectronic devices by laser ablation inductively coupled plasma mass spectrometry and possibility to measure at nanometer range

Published:2009-05-01 Issue:5 Volume:20 Page:883-890
ISSN:1044-0305
Container-title:Journal of the American Society for Mass Spectrometry
language:en
Short-container-title:J. Am. Soc. Mass Spectrom.

Author:

Zoriy Myroslav V.¹,Mayer Dirk²,Becker J. Sabine¹

Affiliation:

1. Central Division of Analytical Chemistry, Research Centre Juelich, D-52425, Juelich, Germany

2. Institute of Bio- and Nanosystems, Research Centre Juelich, Juelich, Germany

Publisher

American Chemical Society (ACS)

Subject

Spectroscopy,Structural Biology

Link

https://pubs.acs.org/doi/pdf/10.1016/j.jasms.2009.01.004

Reference36 articles.

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3. Labelfree fully electronic nucleic acid detection system based on a field-effect transistor device

4. Electrochemical deposition of nanocrystalline PbSe layers onto p-Si (100) wafers

5. Thermal and optical properties of AgSbS2 thin films prepared by pulsed laser deposition (PLD)

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