Thickness-dependent microstructure, resistive switching, ferroelectric, and energy storage properties of pulsed laser deposited 0.85[0.6Ba(Zr0.2Ti0.8)O3-0.4(Ba0.7Ca0.3)TiO3]-0.15SrTiO3 thin films

Author:

Tasneem Muhassinah,Monteiro Carlos R.P.,Kumar N.S. Kiran,Silva J.P.B.ORCID,Sekhar K.C.ORCID,Kamakshi K.,Pereira M.ORCID

Funder

Science and Engineering Research Board

Fundação para a Ciência e a Tecnologia

Horizon 2020

Department of Science and Technology, Ministry of Science and Technology, India

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Process Chemistry and Technology,Ceramics and Composites,Electronic, Optical and Magnetic Materials

Reference38 articles.

1. Ferroelectric memories;Scott;Sci (New York, N.Y.).,1989

2. Observation of large enhancement in energy-storage properties of lead-free polycrystalline 0.5BaZr0.2Ti0.8O3–0.5Ba0.7Ca0.3TiO3 ferroelectric thin films;Puli;J. Phys. D Appl. Phys.,2015

3. Enhancing the dielectric relaxor behavior and energy storage properties of 0.6Ba(Zr0.2Ti0.8)O3–0.4(Ba0.7Ca0.3)TiO3 ceramics through the incorporation of paraelectric SrTiO3

4. Enhanced energy storage properties and temperature stability of fatigue-free La-modified PbZrO3 films under low electric fields;Chen;J. Electroceram.,2014

5. High energy-storage performance in Pb0. 91La0.09 (Ti0.65Zr0.35) O3 relaxor ferroelectric thin films;Hao;J. Appl. Phys.,2012

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