Effects of loading rate and temperature on domain switching and evolutions of reference remnant state variables during polarization reversal in a PZT wafer-Reference-Cited by-同舟云学术

Effects of loading rate and temperature on domain switching and evolutions of reference remnant state variables during polarization reversal in a PZT wafer

Published:2012-03 Issue:2 Volume:38 Page:1115-1126
ISSN:0272-8842
Container-title:Ceramics International
language:en
Short-container-title:Ceramics International

Author:

Lee Najae,Kim Sang-Joo

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Process Chemistry and Technology,Ceramics and Composites,Electronic, Optical and Magnetic Materials

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