Characterization of geomorphological features of lunar surface using Chandrayaan-1 Mini-SAR and LRO Mini-RF data
Author:
Funder
Indian Space Research Organisation
Publisher
Elsevier BV
Subject
Earth-Surface Processes
Reference45 articles.
1. Using K-fold cross validation proposed models for SpikeProp learning enhancements;Ahmed;Int. J. Eng. Technol.,2018
2. Estimation of optical maturity parameter for lunar soil characterization using Moon Mineralogy Mapper (M3);Ajith Kumar;Adv. Space Res.,2014
3. Moon: prospective energy and material resources;Badescu,2012
4. Remote estimation of dielectric constant of lunar surface regolith using compact polarimetric synthetic aperture radar data;Bhattacharya;Adv. Space Res.,2015
5. Polarimetric Modeling of Lunar Surface for Scattering Information Retrieval Using Mini-SAR Data of Chandrayaan-1;Bhavya,2013
Cited by 13 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. An insight into India's Moon mission – Chandrayan-3: The first nation to land on the southernmost polar region of the Moon;Planetary and Space Science;2024-03
2. Synergistic use of remote sensing data and in-situ investigations to characterize the lunar surface;Advances in Space Research;2024-02
3. Characterization of the Moon’s South polar craters using optical, microwave and thermal remote sensing;Advances in Space Research;2024-02
4. A Spectrophotometric evaluation of lunar nearside craters Catharina and Cyrillus for estimations of FeO, optical maturity and TiO2;Advances in Space Research;2024-02
5. Removing the Effect of Lunar Topography on Mini-RF SAR Polarimetric Parameters Through DEM Data;IEEE Geoscience and Remote Sensing Letters;2024
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3