Characterization of nanoscale atomic motion of Si in polycrystalline Cu layer-Reference-Cited by-同舟云学术

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Characterization of nanoscale atomic motion of Si in polycrystalline Cu layer

Published:2024-02 Issue:3 Volume:10 Page:e25516
ISSN:2405-8440
Container-title:Heliyon
language:en
Short-container-title:Heliyon

Author:

Takáts Viktor^ORCID,Bodnár Eszter,Kaganovskii Yuri,Fodor Tamás^ORCID,Hakl József,Molnár Sándor^ORCID,Soha Márton,Vad Kálmán^ORCID

Publisher

Elsevier BV

Reference27 articles.

1. Handbook of Grain and Interphase Boundary Diffusion Data;Kaur,1989

2. Fundamentals of Grain and Interphase Boundary Diffusion;Kaur,1995

3. Grain boundary diffusion: fundamentals to recent developments;Mishin;Int. Mater. Rev.,1997

4. Chr. Herzig, Grain boundary diffusion: recent progress and future research;Mishin;Mater. Sci. Eng., A,1999

5. Grain boundary diffusion in metals: recent development;Herzig;Mater. Trans.,2003

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