A cone formation theory of contamination in high resolution transmission electron microscopy-Reference-Cited by-同舟云学术

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A cone formation theory of contamination in high resolution transmission electron microscopy

Published:1990 Issue:1-2 Volume:21 Page:13-28
ISSN:0739-6260
Container-title:Micron and Microscopica Acta
language:en
Short-container-title:Micron and Microscopica Acta

Author:

Kanaya Koichi,Yonehara Katsuhisa,Oho Eisaku,Inoue Nobuhiro,Izumida Masaki

Publisher

Elsevier BV

Subject

Anatomy

Reference32 articles.

1. Specimen preparation techniques;Adachi,1982

2. Formation of thin polymer films by electron bombardment;Christy;J. appl. Phys.,1960

3. Particle growth in the electron microscope;Cosslett;J. appl. Phys.,1947

4. Solid State Physics,1975

5. Reduction of electron beam induced radiation damage of organic material by cooling to 4K (cryo electron microscopy);Dietrich,1982

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1. Electron-Beam-Induced Carbon Contamination in STEM-in-SEM: Quantification and Mitigation;Microscopy and Microanalysis;2022-12-20

2. Dynamic growth of carbon nanopillars and microrings in electron beam induced dissociation of residual hydrocarbons;Ultramicroscopy;2008-08

3. High resolution radially symmetric nanostructures from simultaneous electron beam induced etching and deposition;Nanotechnology;2007-12-06

4. Examination of Atomic (Scanning) Force Microscopy Probe Tips with the Transmission Electron Microscope;Microscopy and Microanalysis;1997-05

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