Calculation of tilt angles for crystal specimen orientation adjustment using double-tilt and tilt-rotate holders-Reference-Cited by-同舟云学术

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Calculation of tilt angles for crystal specimen orientation adjustment using double-tilt and tilt-rotate holders

Published:1989-01 Issue:3-4 Volume:20 Page:255-259
ISSN:0739-6260
Container-title:Micron and Microscopica Acta
language:en
Short-container-title:Micron and Microscopica Acta

Author:

Qing Liu,Qing-Chang Meng,Bande Hong

Publisher

Elsevier BV

Subject

Anatomy

Reference3 articles.

1. Computer software for specimen orientation adjustment using double-tilt or tilt-rotate holders;Chou;J. Electron Microscope Technique,1987

2. Practical Electron Microscopy in Materials Science;Edington,1975

3. A simple method for the direct measurement of diffraction patterns in the EM400T transmission electron microscope;Tambuyser;J. Phys. E: Sci. Instrum.,1983

Cited by 16 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Nanocartography: Planning for success in analytical electron microscopy;Elemental Microscopy;2024-07-01

2. Revisiting calculation of tilt angles for double‐tilt sample holders in transmission electron microscopes;Microscopy Research and Technique;2024-06-26

3. Unraveling evolution of microstructural domains in the heteroepitaxy of β -Ga2O3 on sapphire;Applied Physics Letters;2024-03-18

4. NanoCartography: Mathematics of Crystal Orientation in Double Tilt Holders;Microscopy and Microanalysis;2020-07-30

5. A simple program for fast tilting electron-beam sensitive crystals to zone axes;Ultramicroscopy;2020-04

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