Ion-induced Auger electron spectroscopy—A new detection method for compositional homogeneities of alloyed atoms in silicon-Reference-Cited by-同舟云学术

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Ion-induced Auger electron spectroscopy—A new detection method for compositional homogeneities of alloyed atoms in silicon

Published:1979-09 Issue:1 Volume:2 Page:125-130
ISSN:0165-1633
Container-title:Solar Energy Materials
language:en
Short-container-title:Solar Energy Materials

Author:

Hiraki Akio,Imura Takeshi,Iwami Motohiro,Kim Su-Chol,Ushita Katsumi,Okamoto Hiroaki,Kamakawa Yoshihiro

Publisher

Elsevier BV

Subject

General Engineering

Reference7 articles.

1. Amorphous silicon solar cells

2. Heterojunctions and Metal-Semiconductor Junctions;Milnes,1972

3. Si(LMM) Auger Electron Emission from Si Alloys by keV Ar+Ion Bombardment, New Effect and Application

4. Comparison of Auger spectra of Mg, Al, and Si excited by low−energy electron and low−energy argon−ion bombardment

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Ab initioglobal optimization of the structures ofSinH,n=4–10, using parallel genetic algorithms;Physical Review A;2005-11-18

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