Copper on sapphire: Stability of thin films at 0.7 Tm-Reference-Cited by-同舟云学术

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Copper on sapphire: Stability of thin films at 0.7 Tm

Published:1989-11 Issue:11 Volume:37 Page:2947-2952
ISSN:0001-6160
Container-title:Acta Metallurgica
language:en
Short-container-title:Acta Metallurgica

Author:

Kennefick C.M.,Raj R.

Publisher

Elsevier BV

Subject

General Engineering

Reference12 articles.

1. Quantitative observation of misfit dislocation arrays in low and high angle twist grain boundaries

2. Autonucleation of cavities in thin ceramic films

3. G. Herrmann, H. Gleiter, G. Bäro, Acta metall., 24, 353.

4. The significance of atomic matching for the structure of interphase boundaries

5. Fundamentals of Surface and Thin Film Analysis;Feldman,1986

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