Author:
Bergstrom P.L.,Patel S.V.,Schwank J.W.,Wise K.D.
Subject
Materials Chemistry,Electrical and Electronic Engineering,Metals and Alloys,Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation,Electronic, Optical and Magnetic Materials
Reference16 articles.
1. Recent instrumental developments in surface and thin-film analysis by electron and mass spectrometric techniques;Oechsner;Appl. Surf. Sci.,1993
2. Physics at Surfaces;Zangwill,1988
3. Physics at Surfaces;Zangwill,1988
4. Physics at Surfaces;Zangwill,1988
5. A critique of the Kelvin method of measuring work functions;Surplice;J. Phys.,1970
Cited by
21 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献