1. A virtual platform environment for exploring power, thermal and reliability management control strategies in high-performance multicores;Bartolini;Great Lakes Symp. on VLSI,2010
2. Radiation-induced soft errors in advanced semiconductor technologies;Baumann;IEEE Trans. Dev. Mater. Reliab.,2005
3. Electronic circuit reliability modeling;Bernstein;Microelectron. Reliab.,2006
4. The PARSEC benchmark suite: characterization and architectural implications;Bienia;Int. Conf. on Parallel Architectures and Compilation Techniques,2008
5. Power, thermal, and reliability modeling in nanometer-scale microprocessors;Brooks;IEEE Micro,2007