CCD based high resolution non-destructive testing system for industrial applications-Reference-Cited by-同舟云学术

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CCD based high resolution non-destructive testing system for industrial applications

Published:1997-10 Issue:10-12 Volume:48 Page:1459-1465
ISSN:0969-8043
Container-title:Applied Radiation and Isotopes
language:en
Short-container-title:Applied Radiation and Isotopes

Author:

Nagarkar V.V.,Vasile S.,Gothoskar P.,Gordon J.S.,Gupta T.K.

Publisher

Elsevier BV

Subject

Radiation

Reference18 articles.

1. An improved X-ray intensifying screen;Buchanan;IEEE Transactions on Nuclear Science,1972

2. Rare earth phosphors for X-ray conversion screen;Buchanan,1974

3. Solid-state X-ray imaging;Bueno,1992

4. High resolution digital radiography and 3-D CT;Bueno,1993

5. Spatial resolution in industrial tomography;Chiang;IEEE Transactions on Nuclear Science,1983

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1. Reconstructing Signals of Scintillation Detectors;Russian Journal of Nondestructive Testing;2022-06

2. Large size growth of terbium doped BaCl2/NaCl/KCl eutectic for radiation imaging;Japanese Journal of Applied Physics;2022-02-08

3. Negative threshold voltage shift for LTPS TFTs under x-ray irradiation and gate bias;Semiconductor Science and Technology;2019-08-12

4. Dimension dependent immunity of X-ray irradiation on low-temperature polycrystalline-silicon TFTs;Japanese Journal of Applied Physics;2017-05-02

5. Performance evaluation of CsI screens for X-ray imaging;Chinese Physics C;2014-11

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