The surface geometrical structure effect in in situ X-ray fluorescence analysis of rocks-Reference-Cited by-同舟云学术

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The surface geometrical structure effect in in situ X-ray fluorescence analysis of rocks

Published:1998-12 Issue:12 Volume:49 Page:1713-1720
ISSN:0969-8043
Container-title:Applied Radiation and Isotopes
language:en
Short-container-title:Applied Radiation and Isotopes

Author:

Liangquan Ge,Ye Zhang,Yeshun Chen,Wangchang Lai

Publisher

Elsevier BV

Subject

Radiation

Reference2 articles.

1. The surface geometrical structure effect in X-ray fluorescence analysis of metallic samples;Stankiewicz;X-ray Spectrometry,1983

2. Determination of the ore grade of tunnel walls by in situ X-ray fluorescence analysis;Ye;Nuclear Geophysics,1994

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