Physical Defects Analysis of Mechatronic Systems

Author:

Gautier Christian,Pieraerts Eric,Latry Olivier

Publisher

Elsevier

Reference8 articles.

1. Scanning capacitance microscopy: a valuable tool to diagnose current paths in 3D-capacitors process;Delaroque,2011

2. Comprehensive nanostructural study of SSRM nanocontact on silicon;Delaroque;Microelectronics Reliability,2011

3. Evaluation of digital holography microscopy for roughness control prior wafer direct bonding;Domenges,2013

4. Compared deep class-ab and class-b ageing on AlGaN/GaN HEMT in S-band pulsed-RF operating life;Fonder;Microelectronics Reliability,2012

5. Physical analysis of Schottky contact on power AlGaN/GaN HEMT after pulsed-RF life test;Fonder;Microelectronics Reliability,2012

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