Reliability Prediction of Embedded Electronic Systems: the FIDES Guide-Reference-Cited by-同舟云学术

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Reliability Prediction of Embedded Electronic Systems: the FIDES Guide

Published:2019 Issue: Volume: Page:189-216
ISSN:
Container-title:Embedded Mechatronic Systems
language:
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Author:

Pougnet Philippe,Bayle Franck,Maanane Hichame,Dahoo Pierre Richard

Publisher

Elsevier

Reference6 articles.

1. Modeling & analysis for multiple stress-type accelerated life data;Adamantios;Proceedings, Annual Reliability and Maintainability Symposium,2000

2. Accelerated Life Tests: Modeling and Statistical Analysis;Bagdonavicius,2002

3. The failure law of complex equipment;Drenick;Journal of the Society for Industrial and Applied Mathematics,1960

4. Failure Mechanism and Models for Semiconductor Devices;JEDEC Standards,2011

5. The effect of assuming a homogeneous Poisson process when the true process is power law process;Rigdon;Journal of Quality Technology,1990

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