Electron microscopy of reverse biased p–n junctions-Reference-Cited by-同舟云学术

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Electron microscopy of reverse biased p–n junctions

Published:2000-06 Issue:3 Volume:31 Page:231-236
ISSN:0968-4328
Container-title:Micron
language:en
Short-container-title:Micron

Author:

Beleggia M,Cristofori D,Merli P.G,Pozzi G

Publisher

Elsevier BV

Subject

Cell Biology,Structural Biology,General Physics and Astronomy,General Materials Science

Reference10 articles.

1. Theoretical model for interpreting TEM images of thinned p–n junctions;Capiluppi;Optik,1977

2. Interpretation of holographic contour maps of reverse biased p–n junctions;Capiluppi;Microsc. Microanal. Microstruct.,1995

3. Accurate measurements of mean inner potential of crystal wedges using digital electron holograms;Gajdarziska-Josifovska;Ultramicroscopy,1993

4. Physics and Technology of Semiconductor Devices;Grove,1962

5. Stationary phase approximation of defocused images of p–n junctions;Merli;Optik,1978

Cited by 11 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Electron Holography;Springer Handbook of Microscopy;2019

2. Diffusion in Solid-State Systems;High Temperature Corrosion;2018-12-18

3. Influence of the specimen surfaces on TEM images of reverse-biased p-n junctions;Microscopy of Semiconducting Materials 2001;2018-01-18

4. On the interpretation of out-of-focus TEM observations of reverse-biased p-n junctions;Microscopy of Semiconducting Materials 2003;2018-01-10

5. Interferometric methods for mapping static electric and magnetic fields;Comptes Rendus Physique;2014-02

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