Plasmon dispersion measurements in the electron microscope: Application to carbon solids-Reference-Cited by-同舟云学术

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Plasmon dispersion measurements in the electron microscope: Application to carbon solids

Published:1998-02 Issue:1 Volume:29 Page:1-5
ISSN:0968-4328
Container-title:Micron
language:en
Short-container-title:Micron

Author:

McBride W.E.,Mc Culloch D.G.,McKenzie D.R.,Green D.C.

Publisher

Elsevier BV

Subject

Cell Biology,Structural Biology,General Physics and Astronomy,General Materials Science

Reference17 articles.

1. Experimental energy-loss function,Im[−1ε(q,ω)], for aluminum

2. EELS analysis of vacuum arc-deposited diamond-like films

3. Collective plasmon excitations inC60clusters

4. Absorption and Scattering of Light by Small Particles;Bohren,1983

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. An introduction to the calculation of valence EELS: Quantum mechanical methods for bulk solids;Micron;2013-01

2. Quantitative valence plasmon mapping in the TEM: viewing physical properties at the nanoscale;Ultramicroscopy;2003-09

3. Experimental and theoretical characterization of structure in thin disordered films;Acta Crystallographica Section A Foundations of Crystallography;1999-03-01

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